Materiales de laboratorio
Trademark:
Koehler Instrument Company, Inc.
Conforms to the specifications of:
ASTM D4294, D5059, D6481, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1
Excitation:
50 kV X-Ray Tube; 4W Maximum Power; 6 Tube Filter Positions with Optics; Spill/Contamination Protection
Detection:
High Performance Silicon Drift Semiconductor Detector; Peltier Thermo-Electric Cooling; High Spectral resolution and Count Rate.
Detection Limits (LLD):
Sulfur: 2 ppm in Air (1.3 ppm in He); Nickel: 1.5 ppm; Vanadium: 0.6 ppm; Lead: 0.0003 g/L
The K47910 EDXRF can analyze a large array of elements from 11Na to 92U in solids, liquids, alloys, powders and thin films. The Plus model features a Silicon Drift Detector which delivers exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. Also, the K47901 features a modern smartphone style “icon-driven” user interface and built-in thermal printer. Network connections enable LIMS connectivity.
