ANALIZADOR ELEMENTAL EDXRF DE MESA EDX1000

Trademark:
Koehler Instrument Company, Inc.

Conforms to the specifications of:
ASTM D4294, D5059, D6481, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1

Excitation:
50 kV X-Ray Tube; 4W Maximum Power; 6 Tube Filter Positions with Optics Spill/Contamination Protection

Detection:
High Performance Si PIN Diode Detector, Peltier Thermo-Electric Cooling, Optimum Balance of spectral resolution and max count rate.

Detection Limits (LLD):
Sulfur: 5 ppm in Air (3 ppm in He); Nickel: 1.6 ppm; Vanadium: 3.6 ppm; Iron: 2.7 ppm; Lead: 0.0004 g/L

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Descripción

The K47900 EDXRF can analyze a large array of elements from 11Na to 92U in solids, liquids, alloys, powders and thin films. The semiconductor detector provides superior data quality and the multiple automated tube filters enhance sensitivity. Also, the K47900 features a modern smartphone style “icon-driven” user interface and built-in thermal printer. Network connections enable LIMS connectivity.